Lung-Jen Lee, Wang-Dauh Tseng, Rung-Bin Lin, Chen-Lun Lee. A Multi-dimensional Pattern Run-Length Method for Test Data Compression. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 325-330, IEEE Computer Society, 2009. [doi]
Abstract is missing.