Leonard Lee, Sean Wu, Charles H.-P. Wen, Li-C. Wang. On Generating Tests to Cover Diverse Worst-Case Timing Corners. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 415-426, IEEE Computer Society, 2005. [doi]
Abstract is missing.