Cross-layer error resilience for robust systems

Larkhoon Leem, Hyungmin Cho, Hsiao-Heng Lee, Young Moon Kim, Yanjing Li, Subhasish Mitra. Cross-layer error resilience for robust systems. In 2010 International Conference on Computer-Aided Design (ICCAD 10), November 7-11, 2010, San Jose, CA, USA. pages 177-180, IEEE, 2010. [doi]

Abstract

Abstract is missing.