David Levacq, Takuya Minakawa, Makoto Takamiya, Takayasu Sakurai. A Wide Range Spatial Frequency Analysis of Intra-Die Variations with 4-mm 4000 × 1 Transistor Arrays in 90nm CMOS. In Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, CICC 2007, DoubleTree Hotel, San Jose, California, USA, September 16-19, 2007. pages 257-260, IEEE, 2007. [doi]
Abstract is missing.