Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

D. Lewis, V. Pouget, T. BeauchĂȘne, HervĂ© Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu. Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability, 41(9-10):1471-1476, 2001.

Abstract

Abstract is missing.