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Front Side and Backside OBIT Mappings applied to Single Event Transient Testing

D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu. Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability, 41(9-10):1471-1476, 2001.

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