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D. Lewis, V. Pouget, T. Beauchêne, Hervé Lapuyade, Pascal Fouillat, A. Touboul, Felix Beaudoin, Philippe Perdu. Front Side and Backside OBIT Mappings applied to Single Event Transient Testing. Microelectronics Reliability, 41(9-10):1471-1476, 2001.
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