Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization

C. Leyris, F. Martinez, M. Valenza, A. Hoffmann, J. C. Vildeuil. Random telegraph signal: A sensitive and nondestructive tool for gate oxide single trap characterization. Microelectronics Reliability, 47(4-5):573-576, 2007. [doi]

Abstract

Abstract is missing.