Double cell upsets mitigation through triple modular redundancy

Yuanqing Li, Anselm Breitenreiter, Marko S. Andjelkovic, Junchao Chen, Milan Babic, Milos Krstic. Double cell upsets mitigation through triple modular redundancy. Microelectronics Journal, 96:104683, 2020. [doi]

Abstract

Abstract is missing.