Efficient Identification of Non-Robustly Untestable Path Delay Faults - researchr publication

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Zhongcheng Li, Robert K. Brayton, Yinghua Min. Efficient Identification of Non-Robustly Untestable Path Delay Faults. In Proceedings IEEE International Test Conference 1997, Washington, DC, USA, November 3-5, 1997. pages 992-997, IEEE Computer Society, 1997.

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