Chang-Tsun Li, Chih-Yuan Chang, Yue Li. On the Repudiability of Device Identification and Image Integrity Verification Using Sensor Pattern Noise. In Dasun Weerasinghe, editor, Information Security and Digital Forensics - First International Conference, ISDF 2009, London, United Kingdom, September 7-9, 2009, Revised Selected Papers. Volume 41 of Lecture Notes of the Institute for Computer Sciences, Social Informatics and Telecommunications Engineering, pages 19-25, Springer, 2009. [doi]
Abstract is missing.