A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process

Xiaoyun Li, Houpeng Chen, Yu Lei, Qian Wang, Xi Li, Jie Miao, Zhitang Song. A novel high performance 3×VDD-tolerant ESD detection circuit in advanced CMOS process. IEICE Electronic Express, 14(21):20170899, 2017. [doi]

Abstract

Abstract is missing.