Comprehensive frequency-dependent substrate noise analysis using boundary element methods

Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris. Comprehensive frequency-dependent substrate noise analysis using boundary element methods. In Lawrence T. Pileggi, Andreas Kuehlmann, editors, Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002, San Jose, California, USA, November 10-14, 2002. pages 2-9, ACM, 2002. [doi]

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