You Li, David E. Duarte, Yongping Fan. A 90.9kS/s, 0.7nJ/conversion Hybrid Temperature Sensor in 4nm-class CMOS. In IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022. pages 118-119, IEEE, 2022. [doi]
@inproceedings{LiDF22-0,
title = {A 90.9kS/s, 0.7nJ/conversion Hybrid Temperature Sensor in 4nm-class CMOS},
author = {You Li and David E. Duarte and Yongping Fan},
year = {2022},
doi = {10.1109/VLSITechnologyandCir46769.2022.9830436},
url = {https://doi.org/10.1109/VLSITechnologyandCir46769.2022.9830436},
researchr = {https://researchr.org/publication/LiDF22-0},
cites = {0},
citedby = {0},
pages = {118-119},
booktitle = {IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), Honolulu, HI, USA, June 12-17, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9772-5},
}