Sulin Li, Jianping Gong, John A. McNeill. VCO-Based ADC With Digital Background Calibration in 65nm CMOS. In 16th IEEE International New Circuits and Systems Conference, NEWCAS 2018, Montréal, QC, Canada, June 24-27, 2018. pages 195-199, IEEE, 2018. [doi]
Abstract is missing.