Quanquan Li, Yingke Gao, Tiejun Zhang, Chaohuan Hou. A test approach of combining partial scan with functional testing for high performance processors. In 2011 IEEE 9th International Conference on ASIC, ASICON 2011, Xiamen, China, October 25-28, 2011. pages 381-384, IEEE, 2011. [doi]
Abstract is missing.