Qing'an Li, Yanxiang He, Yong Chen, Chun Jason Xue, Nan Jiang, Chao Xu. A wear-leveling-aware dynamic stack for PCM memory in embedded systems. In Design, Automation & Test in Europe Conference & Exhibition, DATE 2014, Dresden, Germany, March 24-28, 2014. pages 1-4, IEEE, 2014. [doi]
Abstract is missing.