AC-Plus Scan Methodology for Small Delay Testing and Characterization

Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Ching-Cheng Tien, Chi-Hu Wang, Cheng-Wen Wu. AC-Plus Scan Methodology for Small Delay Testing and Characterization. IEEE Trans. VLSI Syst., 21(2):329-341, 2013. [doi]

Authors

Tsung-Yeh Li

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Shi-Yu Huang

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Hsuan-Jung Hsu

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Chao-Wen Tzeng

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Chih-Tsun Huang

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Jing-Jia Liou

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Hsi-Pin Ma

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Po-Chiun Huang

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Jenn-Chyou Bor

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Ching-Cheng Tien

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Chi-Hu Wang

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Cheng-Wen Wu

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