AC-Plus Scan Methodology for Small Delay Testing and Characterization

Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Ching-Cheng Tien, Chi-Hu Wang, Cheng-Wen Wu. AC-Plus Scan Methodology for Small Delay Testing and Characterization. IEEE Trans. VLSI Syst., 21(2):329-341, 2013. [doi]

@article{LiHHTHLMHBTWW13,
  title = {AC-Plus Scan Methodology for Small Delay Testing and Characterization},
  author = {Tsung-Yeh Li and Shi-Yu Huang and Hsuan-Jung Hsu and Chao-Wen Tzeng and Chih-Tsun Huang and Jing-Jia Liou and Hsi-Pin Ma and Po-Chiun Huang and Jenn-Chyou Bor and Ching-Cheng Tien and Chi-Hu Wang and Cheng-Wen Wu},
  year = {2013},
  doi = {10.1109/TVLSI.2012.2187223},
  url = {http://dx.doi.org/10.1109/TVLSI.2012.2187223},
  researchr = {https://researchr.org/publication/LiHHTHLMHBTWW13},
  cites = {0},
  citedby = {0},
  journal = {IEEE Trans. VLSI Syst.},
  volume = {21},
  number = {2},
  pages = {329-341},
}