AC-Plus Scan Methodology for Small Delay Testing and Characterization

Tsung-Yeh Li, Shi-Yu Huang, Hsuan-Jung Hsu, Chao-Wen Tzeng, Chih-Tsun Huang, Jing-Jia Liou, Hsi-Pin Ma, Po-Chiun Huang, Jenn-Chyou Bor, Ching-Cheng Tien, Chi-Hu Wang, Cheng-Wen Wu. AC-Plus Scan Methodology for Small Delay Testing and Characterization. IEEE Trans. VLSI Syst., 21(2):329-341, 2013. [doi]

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