Xiaojun Li, Bing Huang, J. Qin, X. Zhang, Michael Talmor, Z. Gur, Joseph B. Bernstein. Deep Submicron CMOS Integrated Circuit Reliability Simulation with SPICE. In 6th International Symposium on Quality of Electronic Design (ISQED 2005), 21-23 March 2005, San Jose, CA, USA. pages 382-389, IEEE Computer Society, 2005. [doi]
Abstract is missing.