Facial feature localization using statistical models and SIFT descriptors

Zisheng Li, Jun-ichi Imai, Masahide Kaneko. Facial feature localization using statistical models and SIFT descriptors. In 18th IEEE International Symposium on Robot and Human Interactive Communication, RO-MAN 2009, Toyama International Conference Center, Japan, September 27 - October 2, 2009. pages 961-966, IEEE, 2009. [doi]

Abstract

Abstract is missing.