H. Li, Z. Jiang, P. Huang, Y. Wu, H. Y. Chen, B. Gao, X. Y. Liu, J. F. Kang, H.-S. P. Wong. Variation-aware, reliability-emphasized design and optimization of RRAM using SPICE model. In Wolfgang Nebel, David Atienza, editors, Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015. pages 1425-1430, ACM, 2015. [doi]
@inproceedings{LiJHWCGLKW15,
title = {Variation-aware, reliability-emphasized design and optimization of RRAM using SPICE model},
author = {H. Li and Z. Jiang and P. Huang and Y. Wu and H. Y. Chen and B. Gao and X. Y. Liu and J. F. Kang and H.-S. P. Wong},
year = {2015},
url = {http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=7092614},
researchr = {https://researchr.org/publication/LiJHWCGLKW15},
cites = {0},
citedby = {0},
pages = {1425-1430},
booktitle = {Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, DATE 2015, Grenoble, France, March 9-13, 2015},
editor = {Wolfgang Nebel and David Atienza},
publisher = {ACM},
isbn = {978-3-9815370-4-8},
}