Huawei Li, Xiaowei Li, Yu Huang 0005, Ying Wang, Gary Guo. Special Session - Test for AI Chips: from DFT to On-line Testing. In 39th IEEE VLSI Test Symposium, VTS 2021, San Diego, CA, USA, April 25-28, 2021. pages 1, IEEE, 2021. [doi]
Abstract is missing.