Katherine Shu-Min Li, Yi-Yu Liao, Yuo-Wen Liu, Jr-Yang Huang. IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency. In Proceedings of the Eighteentgh Asian Test Symposium, ATS 2009, 23-26 November 2009, Taichung, Taiwan. pages 269-274, IEEE Computer Society, 2009. [doi]
Abstract is missing.