Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing

Yi-Hua Li, Wei-Cheng Lien, Ing-Chao Lin, Kuen-Jong Lee. Capture-Power-Safe Test Pattern Determination for At-Speed Scan-Based Testing. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(1):127-138, 2014. [doi]

Abstract

Abstract is missing.