Yanjing Li, Onur Mutlu, Donald S. Gardner, Subhasish Mitra. Concurrent autonomous self-test for uncore components in system-on-chips. In 28th IEEE VLSI Test Symposium, VTS 2010, April 19-22, 2010, Santa Cruz, California, USA. pages 232-237, IEEE Computer Society, 2010. [doi]
Abstract is missing.