Baozhen Li, K. Paul Muller, James D. Warnock, Leon J. Sigal, Dinesh Badami. A case study of electromigration reliability: From design point to system operations. In IEEE International Reliability Physics Symposium, IRPS 2015, Monterey, CA, USA, April 19-23, 2015. pages 2, IEEE, 2015. [doi]
Abstract is missing.