Maximal Interconnect Resilient Methodology for Fault Tolerance, Yield, and Reliability Improvement in Network on Chip

Katherine Shu-Min Li, Chih-Yun Pai, Liang-Bi Chen. Maximal Interconnect Resilient Methodology for Fault Tolerance, Yield, and Reliability Improvement in Network on Chip. IEICE Transactions, 94-A(12):2649-2658, 2011. [doi]

Abstract

Abstract is missing.