Wei Li, Sudhakar M. Reddy, Irith Pomeranz. On test generation for transition faults with minimized peak power dissipation. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 504-509, ACM, 2004. [doi]
Abstract is missing.