Man-Lap Li, Pradeep Ramachandran, Swarup Kumar Sahoo, Sarita V. Adve, Vikram S. Adve, Yuanyuan Zhou. Trace-based microarchitecture-level diagnosis of permanent hardware faults. In The 38th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2008, June 24-27, 2008, Anchorage, Alaska, USA, Proceedings. pages 22-31, IEEE Computer Society, 2008. [doi]
Abstract is missing.