Huawei Li, Pei-Fu Shen, Xiaowei Li. Robust Test Generation for Precise Crosstalk-induced Path Delay Faults. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 300-305, IEEE Computer Society, 2006. [doi]
Abstract is missing.