Operating System Mechanisms for TPM-Based Lifetime Measurement of Process Integrity

Xiao Li, Wenchang Shi, Zhaohui Liang, Bin Liang, Zhiyong Shan. Operating System Mechanisms for TPM-Based Lifetime Measurement of Process Integrity. In IEEE 6th International Conference on Mobile Adhoc and Sensor Systems, MASS 2009, 12-15 October 2009, Macau (S.A.R.), China. pages 783-789, IEEE, 2009. [doi]

Abstract

Abstract is missing.