Dynamic Analysis and Testing of a Double-layer Isolator with an Electromagnetic Negative Stiffness Mechanism

Qimin Li, Anpeng Sun, Huayan Pu, Jun Luo 0006, Lisheng Mou, Jiahao Zhu, Jinglei Zhao, Xueping Li, Ruqing Bai, Jin Yi, Zhe Li, Shujin Yuan. Dynamic Analysis and Testing of a Double-layer Isolator with an Electromagnetic Negative Stiffness Mechanism. In International Conference on Advanced Robotics and Mechatronics, ICARM 2024, Tokyo, Japan, July 8-10, 2024. pages 562-567, IEEE, 2024. [doi]

Abstract

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