A Fully Affine Invariant Feature detector

Wei Li, Zelin Shi, Jian Yin. A Fully Affine Invariant Feature detector. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 2768-2771, IEEE, 2012. [doi]

Abstract

Abstract is missing.