Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage

Wei Li, Seongmoon Wang, Srimat T. Chakradhar, Sudhakar M. Reddy. Distance Restricted Scan Chain Reordering to Enhance Delay Fault Coverage. In 18th International Conference on VLSI Design (VLSI Design 2005), with the 4th International Conference on Embedded Systems Design, 3-7 January 2005, Kolkata, India. pages 471-478, IEEE Computer Society, 2005. [doi]

Abstract

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