Sensitivities of Bilayer Graphene FET Performance to Bipolar Characteristics

Jing Li, Wensheng Wei, Yuxing Dai. Sensitivities of Bilayer Graphene FET Performance to Bipolar Characteristics. In Third International Conference on Digital Manufacturing & Automation, ICDMA 2012, Guilin, China, July 31 - Aug. 2, 2012. pages 763-766, IEEE, 2012. [doi]

Abstract

Abstract is missing.