On reducing both shift and capture power for scan-based testing

Jia Li, Qiang Xu, Yu Hu, Xiaowei Li. On reducing both shift and capture power for scan-based testing. In Proceedings of the 13th Asia South Pacific Design Automation Conference, ASP-DAC 2008, Seoul, Korea, January 21-24, 2008. pages 653-658, IEEE, 2008. [doi]

Abstract

Abstract is missing.