A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs

Tianjian Li, Feng Xie, Xiaoyao Liang, Qiang Xu, Krishnendu Chakrabarty, Naifeng Jing, Li Jiang. A Novel Test Method for Metallic CNTs in CNFET-Based SRAMs. IEEE Trans. on CAD of Integrated Circuits and Systems, 35(7):1192-1205, 2016. [doi]

Abstract

Abstract is missing.