A reliability integrated acceptance test plan for series systems whose components following exponential distributions

Xue-jing Li, Dan Yu. A reliability integrated acceptance test plan for series systems whose components following exponential distributions. In 2011 IEEE International Conference on Intelligence and Security Informatics, ISI 2011, Beijing, China, 10-12 July, 2011. pages 339-344, IEEE, 2011. [doi]

Abstract

Abstract is missing.