On-chip accumulated jitter measurement for phase-locked loops

Chih-Feng Li, Shao-Sheng Yang, Tsin-Yuan Chang. On-chip accumulated jitter measurement for phase-locked loops. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 1184-1187, ACM Press, 2005. [doi]

Abstract

Abstract is missing.