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RandEye: On-Sensor Stochastic Image Transformation for Backdoor-Resistant Edge Inference

Wantong Li, Liuwan Zhu. RandEye: On-Sensor Stochastic Image Transformation for Backdoor-Resistant Edge Inference. In Lu Peng 0001, Boris Vaisband, Fan Chen 0001, Peipei Zhou 0001, Shahar Kvatinsky, Jiafeng Xie, editors, Proceedings of the Great Lakes Symposium on VLSI 2025, GLSVLSI 2025, New Orleans, LA, USA, 30 June 2025 - 2 July 2025. pages 486-491, ACM, 2025. [doi]

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