Xiaoyu Lian, Sherief Reda, Jacob K. Rosenstein. Simultaneous Estimation of Temperature and Voltage from Digital Delay Diversity. In 28th IFIP/IEEE International Conference on Very Large Scale Integration, VLSI-SOC 2020, Salt Lake City, UT, USA, October 5-7, 2020. pages 40-45, IEEE, 2020. [doi]
Abstract is missing.