Feifei Liao, Yiqing Ding, Yinyin Lin, Tingao Tang, Baowei Qiao, Yunfeng Lai, Jie Feng, Bomy Chen. Characterization of Ge::2::Sb::2::Te::5:: thin film transistor and its application in non-volatile memory. Microelectronics Journal, 37(8):841-844, 2006. [doi]
Abstract is missing.