Michael R. Lightner, Gary D. Hachtel. Implication algorithms for MOS switch level functional macromodeling implication and testing. In James S. Crabbe, Charles E. Radke, Hillel Ofek, editors, Proceedings of the 19th Design Automation Conference, DAC '82, Las Vegas, Nevada, USA, June 14-16, 1982. pages 691-698, ACM/IEEE, 1982. [doi]
Abstract is missing.