J.-H. Lim, N. Raghavan, V. B. Naik, J. H. Kwon, K. Yamane, H. Yang, K. H. Lee, K. L. Pey. Correct Extrapolation Model for TDDB of STT-MRAM MgO Magnetic Tunnel Junctions. In IEEE International Reliability Physics Symposium, IRPS 2019, Monterey, CA, USA, March 31 - April 4, 2019. pages 1-7, IEEE, 2019. [doi]
Abstract is missing.