Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband Power Amplifier

Qian Lin, Qian-Fu Cheng, Jun-jie Gu, Yuanyuan Zhu, Chao Chen, Haipeng Fu. Design and Temperature Reliability Testing for A 0.6-2.14GHz Broadband Power Amplifier. J. Electronic Testing, 32(2):235-240, 2016. [doi]

Abstract

Abstract is missing.