A comparison of technology trajectories between the global and the United States in smart grid

Siou-Zih Lin, Ssu-Han Chen, Chun-Chieh Wang, Dar-Zen Chen. A comparison of technology trajectories between the global and the United States in smart grid. In 2011 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM), Singapore, Singapore, December 6-9, 2011. pages 1028-1032, IEEE, 2011. [doi]

Abstract

Abstract is missing.