Sen-Pin Lin, Sandeep K. Gupta, Melvin A. Breuer. A Low Cost BIST Methodology and Associated Novel Test Pattern Generator. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 106-112, IEEE Computer Society, 1994.
Abstract is missing.