W.-A. Lin, C. C. Lee, J.-L. Huang. Sigma-delta modulation based wafer-level testing for TFT-LCD source driver ICs. In 29th IEEE VLSI Test Symposium, VTS 2011, May 1-5, 2011, Dana Point, California, USA. pages 315-320, IEEE Computer Society, 2011. [doi]
Abstract is missing.